The surface morphology of samples with the highest levels of migration determined by ICP-MS was observed using SEM (S- 3400N, Hitachi High-Technologies Corporation, Japan). SEM images were obtained at a voltage of 20 kV and pressure of 1torr. Elemental mapping of food samples was performed using EDS. Analysis occurred with EDS switched to environmental scanning mode, coupled with a Thermo-Noran Vantage light element energy dispersive X-ray detector. The characterisation of each element was obtained by X-ray spectroscopy under electron flux with INCA software Oxford, UK.